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DeCS
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Descriptor English:
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Microscopy, Atomic Force
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Descriptor Spanish:
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Microscopía de Fuerza Atómica
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Descriptor Portuguese:
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Microscopia de Força Atômica
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Synonyms English:
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Atomic Force Microscopies
Atomic Force Microscopy
Force Microscopies
Force Microscopies, Scanning
Force Microscopy
Force Microscopy, Scanning
Microscopies, Atomic Force
Microscopies, Force
Microscopies, Scanning Force
Microscopy, Force
Microscopy, Scanning Force
Scanning Force Microscopies
Scanning Force Microscopy
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Tree Number:
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E01.370.350.515.666.400
E05.595.666.400
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Definition English:
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A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample. |
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See Related English:
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Microscopy, Scanning Tunneling
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History Note English:
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95
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Allowable Qualifiers English:
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Record Number:
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32147
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Unique Identifier:
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D018625
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Occurrence in VHL:
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Similar:
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DeCS
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